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Diagonal 28.47 mm (Type 1.8) 12.47M-Effective Pixel CMOS Sensor
for Consumer Digital SLR Cameras Features Column-Parallel A/D Conversion,
High Speed, and High Picture Quality in the APS Size
IMX021
To respond to the increasing demands for picture quality at high ISO sensitivities
and higher continuous drive rates in digital SLR cameras, Sony
has developed and is now releasing the next-generation IMX021 12.47M-pixel
APS size CMOS sensor.
This device adopts the column-parallel A/D conversion method and
achieves high speed and low noise by direct A/D conversion of the signals
from the pixels.
This device achieves characteristics appropriate for the next generation
of digital SLR cameras. |
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| IMX021 |
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* Diagonal 28.47 mm (Type 1.8),
12.47M effective pixels
* Column-parallel A/D conversion
* Low noise
* Fast continuous drive rate of 10.39
frame/s
* Imaging characteristics appropriate
for digital SLR cameras |
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The IMX021 was developed to respond
to needs for continuous drive performance,
which is desired in digital SLR cameras,
and picture quality at high ISO sensitivities,
and is a diagonal 28.47 mm (Type 1.8)
12.47M effective pixel CMOS sensor. |
 High Speed and Low Noise |
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The IMX021 adopts the column-parallel
A/D conversion method to achieve high
speed and low noise. Compared to structures
that do not perform parallel processing,
the column-parallel A/D conversion
method allows A/D conversion at lower
clock frequencies and can achieve even
lower noise levels since it is less susceptible
to high-frequency band noise components.
Furthermore, a dual noise cancellation
system in which in addition to the analog
CDS, digital CDS circuits are placed in
each column is adopted to reduce pixel
noise. In addition, at the same time this
also reduces differences between the analog
CDS circuits and the A/D converters
and achieves even higher picture quality.
(See figure 1.) Also, since no noise can
enter the signal after conversion to digital,
the image data can be output at high
speeds.
In this device, we achieved both the
industry’s highest pixel count*1 of 12.47M
pixels and high-speed imaging at 10.39
frame/s at the same time.
*1 As of August 2007. |
| Imaging Characteristics that
Support Digital SLR Cameras |
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For this product, we developed a new
wafer process for large-scale CMOS sensors.
This process takes advantage of
Sony’s high picture quality technologies
nurtured over years of experience in CCD
development. This allowed us to achieve
imaging characteristics that can support
digital SLR cameras. (See table 2.) This
device achieves a saturation signal level
of 1100 mV and a sensitivity of 500 mV
despite being a high pixel count 12.47M
pixel device, and provides high picture
quality imaging appropriate for digital
SLR cameras.
Furthermore, this sensor features a condensing
design that can handle a wide
range of incident angles at the sensor and
thus can support the diverse interchangeable
lenses used on digital SLR cameras.
Furthermore, this device achieves consistent
pixel characteristics across the chip
surface despite being a large-scale device
with a 28.47 mm diagonal. |
| Included Functions |
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The IMX021 includes a built-in 24 dB
programmable gain amplifier that can provide
fully adequate gain in the analog domain.
It also includes a “window readout”
function that can read out part of the image.
This function makes imaging at even
higher frame rates possible by limiting the
area of the image read out. |
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•••• Mr. Ueno ••••
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Although we faced many difficulties
since both the wafer process
and the sensor structure were new
development efforts, everyone on
the team took pleasure in these
challenges and we solved them
one by one. The IMX021 developed
in this manner can record pleasurable
moments for posterity. I
strongly recommend that you look
into this device. |
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See
all articles with figures and tables.  |
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Vol.50 |
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