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Compared to the existing 0.61-type full
HD SXRD211 (developed in September
2005), the SXRD221 doubles the LCD
drive frequency to 240 Hz and can support
a 120 Hz frame rate display. In combination
with the extremely fast LCD response
performance which was an early
feature of this technology, this device can
provide fine-grained video expression with
extremely low levels of motion picture
blurring in video display. |
Features of the SXRD Device |
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Sony’s “SXRD” technology achieves
high-speed response performance and high
contrast due to the adoption of a normally
black LCD with unique specifications and
a thin LCD cell gap structure. These devices
provide a natural and smooth film-like
video image due to their narrow inter-pixel space structure. Due to these features,
“SXRD” devices are expected to provide high picture quality performance
rich in presence and are used in home use
front projection, projection TV, and digital
cinema projectors. |
Improved LCD Response
Speed |
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To improve motion picture quality even
further, Sony made the response speed of
this device even faster. It is known that in
general the LCD response speed becomes
faster inversely proportional to the square
of the thickness of the LCD cell gap. The
SXRD221 achieves the faster LCD response
speed of 2.0 ms due to the achievement
of a thin cell gap by optimizing
Sony's original wafer-based panel assembly
process. Thus Sony was able to produce
more than adequate display performance
for a high 120 Hz frame rate. |
Newly Designed Noise
Reduction Circuit |
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Achieving 120 Hz display requires transferring
the data twice as fast as the conventional
data rate of 60 Hz. As a result,
the circuits become more easily influenced
by the inductance of the wiring lines and
the picture quality could be degraded. To
resolve this issue, Sony developed an optimized
structure for return current distribution
for the analog signals and achieved
high picture quality with extremely low
noise levels. |
Multi-Dimensional
Optimization of the Wiring
Layout |
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To handle the doubled transfer capacitance,
normally, the density of wiring on
the silicon backplane peripheral area increases
and the density difference with the
internal of the devices increases. When
this happens the surface height differences
are aggravated and it becomes easier for
imaging defects to appear. Therefore Sony
optimized, in multiple dimensions, the
wiring layout on the silicon backplane. In
particular, all layers were optimized so that
each wiring layer mutually complemented
another, step heights between the pixel
area and the circuit area and step heights
in just the circuit area were minimized, and
a high planarization was achieved in this
device, which constrains the LCD cell gap.
The Sony SXRD device, which achieves,
among other characteristics, the high contrast
of 20,000:1 due to the use of Sony
original optical technologies, will continue
to evolve in the future. |